L.K. Nanver: search on Z-Library

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1

Electrothermal characterization of silicon-on-glass VDMOSFETs

N. Nenadović, V. Cuoco, S.J.C.H. Theeuwen, L.K. Nanver, H. Schellevis, G. Spierings, H.F.F. Jos, J.W. Slotboom

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 410 KB

english, 2005

2

Fabrication of nanofluidic devices in glass with polysilicon electrodes

V.G. Kutchoukov, L. Pakula, G.O.F. Parikesit, Y. Garini, L.K. Nanver, A. Bossche

Journal:

Sensors and Actuators A: Physical

Year:

2005

Language:

english

File:

PDF, 501 KB

english, 2005

3

Integration of MOSFETs with SiGe dots as stressor material

L.K. Nanver, V. Jovanović, C. Biasotto, J. Moers, D. Grützmacher, J.J. Zhang, N. Hrauda, M. Stoffel, F. Pezzoli, O.G. Schmidt, L. Miglio, H. Kosina, A. Marzegalli, G. Vastola, G. Mussler, J. Stangl, G

Journal:

Solid-State Electronics

Year:

2011

Language:

english

File:

PDF, 1.89 MB

english, 2011

4

[IEEE Fifth International Conference on Solid-State and Integrated Circuit Technology-ICSICT'98 - Beijing, China (21-23 Oct. 1998)] 1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.98EX105) - Characterisation of low-stress LPCVD silicon nitride in high frequency BJT's with self-aligned metallization

Van Zeijl, H.W., Nanver, L.K.

Year:

1998

Language:

english

File:

PDF, 233 KB

english, 1998

5

[IEEE 2010 18th International Conference on Advanced Thermal Processing of Semiconductors (RTP) - Gainesville, FL, USA (2010.09.28-2010.10.1)] 2010 18th International Conference on Advanced Thermal Processing of Semiconductors (RTP) - Pure-boron chemical-vapor-deposited layers: A new material for silicon device processing

Nanver, L.K., Scholtes, T. L. M., Sarubbi, F., de Boer, W.B., Lorito, G., Sakic, A., Milosavljevic, S., Mok, C., Shi, L., Nihtianov, S., Buisman, K.

Year:

2010

Language:

english

File:

PDF, 738 KB

english, 2010

6

Thermal Design of Multifinger Bipolar Transistors

La Spina, L., d'Alessandro, V., Russo, S., Nanver, L.K.

Journal:

IEEE Transactions on Electron Devices

Year:

2010

Language:

english

File:

PDF, 905 KB

english, 2010

7

[IEEE 2009 Proceedings of the European Solid State Device Research Conference (ESSDERC) - Athens, Greece (2009.09.14-2009.09.18)] 2009 Proceedings of the European Solid State Device Research Conference - C-V profiling of ultrashallow junctions using a step-like background doping profile

Popadic, Milos, Xu, Cuiqin, Sarubbi, Francesco, Nanver, Lis K.

Year:

2009

Language:

english

File:

PDF, 1004 KB

english, 2009

8

Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors

Nenadovic, N., Mijalkovic, S., Nanver, L.K., Vandamme, L.K.J., d'Alessandro, V., Schellevis, H., Slotboom, J.W.

Journal:

IEEE Journal of Solid-State Circuits

Year:

2004

Language:

english

File:

PDF, 590 KB

english, 2004

9

[IEEE 2007 15th International Conference on Advanced Thermal Processing of Semiconductors - Cannizzaro, Catania, Italy (2007.10.2-2007.10.5)] 2007 15th International Conference on Advanced Thermal Processing of Semiconductors - Silicon Laser Annealing by a Two-Pulse Laser System with Variable Pulse Offsets

Gonda, V., Slabbekoorn, J., Nanver, L.K.

Year:

2007

Language:

english

File:

PDF, 2.66 MB

english, 2007

10

defect structures from implantations of radioactive tellurium

Larsen, A. Nylandsted, Weyer, G., Nanver, L.

Journal:

Physical Review B

Year:

1980

Language:

english

File:

PDF, 761 KB

english, 1980

11

[IEEE 2007 15th International Conference on Advanced Thermal Processing of Semiconductors - Cannizzaro, Catania, Italy (2007.10.2-2007.10.5)] 2007 15th International Conference on Advanced Thermal Processing of Semiconductors - Ultra-Shallow Dopant Diffusion from Pre-Deposited RPCVD Monolayers of Arsenic and Phosphorus

Popadic, Milos, Nanver, Lis K., Scholtes, T.L.M.

Year:

2007

Language:

english

File:

PDF, 2.24 MB

english, 2007

12

Silicon-Based Technology for Integrated Waveguides and mm-Wave Systems

Jovanovic, Vladimir, Gentile, Gennaro, Dekker, Ronald, de Graaf, Pascal, de Vreede, Leo C. N., Nanver, Lis K., Spirito, Marco

Journal:

IEEE Transactions on Electron Devices

Year:

2015

Language:

english

File:

PDF, 5.02 MB

english, 2015

13

Restricted-Access Al-Mediated Material Transport in Al Contacting of PureGaB Ge-on-Sip+nDiodes

Sammak, Amir, Qi, Lin, Nanver, Lis K.

Journal:

Journal of Electronic Materials

Year:

2015

Language:

english

File:

PDF, 1.24 MB

english, 2015

14

Electrical detection and simulation of stress in silicon nitride spacer technology

H. W. van Zeijl, S. Mijalcovic, L. K. Nanver

Journal:

Journal of Materials Science: Materials in Electronics

Year:

2001

Language:

english

File:

PDF, 242 KB

english, 2001

15

[IEEE Digest of Papers. 2004 Topical Meeting onSilicon Monolithic Integrated Circuits in RF Systems, 2004. - Atlanta, GA, USA (8-10 Sept. 2004)] Digest of Papers. 2004 Topical Meeting onSilicon Monolithic Integrated Circuits in RF Systems, 2004. - Design and characterization of a high-resistivity silicon traveling wave amplifier for 10 Gb/s optical communication systems

De Paola, F.M., de Vreede, L.C.N., Nanver, L.K., Rinaldi, N., Burghartz, J.N.

Year:

2004

Language:

english

File:

PDF, 588 KB

english, 2004

16

[IEEE 2009 17th International Conference on Advanced Thermal Processing of Semiconductors (RTP) - Albany, NY, USA (2009.09.29-2009.10.2)] 2009 17th International Conference on Advanced Thermal Processing of Semiconductors - Application of laser annealing in the EU FP6 project D-DotFET

Nanver, L. K., Jovanovic, V., Biasotto, C., van der Cingel, J., Milosavljevic, S.

Year:

2009

Language:

english

File:

PDF, 798 KB

english, 2009

17

Reduction of surface roughness of a silicon chip for advanced nanocalorimetry

Luigi La Spina, Denis Ovchinnikov, Wim H.A. Wien, Alexander W. van Herwaarden, Egbert J.G. Goudena, Joachim Loos, Lis K. Nanver

Journal:

Sensors and Actuators A: Physical

Year:

2008

Language:

english

File:

PDF, 1.22 MB

english, 2008

18

[IEEE 2007 IEEE Radio Frequency Integrated Circuits Symposium - Honolulu, HI, USA (2007.06.3-2007.06.5)] 2007 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - A Low-Loss Compact Linear Varactor Based Phase-Shifter

Qureshi, J.H., Kim, S., Buisman, K., Huang, C., Pelk, M. J., Akhnoukh, A., Larson, L.E., Nanver, L. K., de Vreede, L.C.N.

Year:

2007

Language:

english

File:

PDF, 363 KB

english, 2007

19

[IEEE 2005 13th International Conference on Advanced Thermal Processing of Semiconductors - Santa Barbara, CA, USA (04-07 Oct. 2005)] 2005 13th International Conference on Advanced Thermal Processing of Semiconductors - Near-Ideal Implanted Shallow-Junction Diode Formation by Excimer Laser Annealing

Gonda, V., Burtsev, A., Scholtes, T.L.M., Nanver, L.K.

Year:

2005

Language:

english

File:

PDF, 3.61 MB

english, 2005

20

[IEEE 2009 Proceedings of the European Solid State Device Research Conference (ESSDERC) - Athens, Greece (2009.09.14-2009.09.18)] 2009 Proceedings of the European Solid State Device Research Conference - Bulk-Si FinFET technology for ultra-high aspect-ratio devices

Jovanovic, Vladimir, Nanver, Lis K., Suligoj, Tomislav, Poljak, Mirko

Year:

2009

Language:

english

File:

PDF, 1.43 MB

english, 2009

21

FM radio receiver front-end circuitry with on-chip SAW filters

van Zeijl, P.T.M., Visser, J.H., Nanver, L.K.

Journal:

IEEE Transactions on Consumer Electronics

Year:

1989

Language:

english

File:

PDF, 724 KB

english, 1989

22

Ultra-high aspect-ratio FinFET technology

Vladimir Jovanović, Tomislav Suligoj, Mirko Poljak, Yann Civale, Lis K. Nanver

Journal:

Solid-State Electronics

Year:

2010

Language:

english

File:

PDF, 974 KB

english, 2010

23

Al/Si contacting of ultra-shallow epitaxially grown Si and SiGe junctions

Q. W. Ren, L. K. Nanver, C. C. G. Visser, J. W. Slotboom

Journal:

Journal of Materials Science: Materials in Electronics

Year:

2001

Language:

english

File:

PDF, 555 KB

english, 2001

24

[IEEE 2008 16th International Conference on Advanced Thermal Processing of Semiconductors (RTP) - Las Vegas, NV, USA (2008.09.30-2008.10.3)] 2008 16th IEEE International Conference on Advanced Thermal Processing of Semiconductors - Ultrashallow doping by excimer laser drive-in of RPCVD surface deposited arsenic monolayers

Popadic, Milos, Nanver, Lis K., Biasotto, Cleber, Gonda, Viktor, van der Cingel, Johan

Year:

2008

Language:

english

File:

PDF, 2.46 MB

english, 2008

25

Bulk-Micromachined Test Structure for Fast and Reliable Determination of the Lateral Thermal Conductivity of Thin Films

La Spina, Luigi, van Herwaarden, Alexander W., Schellevis, Hugo, Wien, Wim H. A., Nenadovic, Neboja, Nanver, Lis K.

Journal:

Journal of Microelectromechanical Systems

Year:

2007

Language:

english

File:

PDF, 801 KB

english, 2007

26

Nanometer-Thin Pure Boron Layers as Mask for Silicon Micromachining

Liu, Xingyu, Nanver, Lis K., Scholtes, Tom L. M.

Journal:

Journal of Microelectromechanical Systems

Year:

2017

Language:

english

File:

PDF, 2.47 MB

english, 2017

27

DIMES-01, a baseline BIFET process for smart sensor experimentation

L.K. Nanver, E.J.G. Goudena, H.W. van Zeijl

Journal:

Sensors and Actuators A: Physical

Year:

1993

Language:

english

File:

PDF, 877 KB

english, 1993

28

Stability Characterization of High-Sensitivity Silicon-Based EUV Photodiodes in a Detrimental Environment

Shi, Lei, Nihtianov, Stoyan, Nanver, Lis K., Scholze, Frank

Journal:

IEEE Sensors Journal

Year:

2013

Language:

english

File:

PDF, 1.02 MB

english, 2013

29

C–V profiling of ultra-shallow junctions using step-like background profiles

Miloš Popadić, Vladimir Milovanović, Cuiqin Xu, Francesco Sarubbi, Lis K. Nanver

Journal:

Solid-State Electronics

Year:

2010

Language:

english

File:

PDF, 484 KB

english, 2010

30

Analysis of the Bipolar Current Mirror Including Electrothermal and Avalanche Effects

Rinaldi, N., d'Alessandro, V., Nanver, L.K.

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 674 KB

english, 2009

31

[IEEE 2007 IEEE/MTT-S International Microwave Symposium - Honolulu, HI, USA (2007.06.3-2007.06.8)] 2007 IEEE/MTT-S International Microwave Symposium - Varactor Topologies for RF Adaptivity with Improved Power Handling and Linearity

Buisman, K., Huang, C., Akhnoukh, A., Marchetti, M., de Vreede, L.C.N., Larson, L.E., Nanver, L.K.

Year:

2007

Language:

english

File:

PDF, 2.29 MB

english, 2007

32

[IEEE Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. - Grenoble, France (12-16 Sept. 2005)] Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. - Base-contact proximity effects in bipolar transistors with nitride-spacer technology

van Zeijl, H., Nanver, L.K.

Year:

2005

Language:

english

File:

PDF, 269 KB

english, 2005

33

[IEEE Multi-Physics simulation and Experiments in Microelectronics - Freiburg im Breisgau, Germany (2008.04.20-2008.04.23)] EuroSimE 2008 - International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems - Aluminum-nitride thin-film heatspreaders integrated in bipolar transistors

La Spina, Luigi, Marano, Ilaria, d'Alessandro, Vincenzo, Schellevis, Hugo, Nanver, Lis K.

Year:

2008

Language:

english

File:

PDF, 1.32 MB

english, 2008

34

Controlling transient enhanced diffusion effects in high-frequency Si[sub 0.7]Ge[sub 0.3], heterojunction bipolar transistors with implanted emitters

Year:

1998

Language:

english

File:

PDF, 511 KB

english, 1998

35

SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Monday 18 September 2000)] Challenges in Process Integration and Device Technology - Backwafer optical lithography and wafer distortion in substrate transfer technologies

Van Zeijl, Henk W., Slabbekoorn, J., Nanver, L. K., Van Dijk, Paul W., Berthold, Axel, Machielsen, T., Burnett, David, Kimura, Shin'ichiro, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 322 KB

english, 2000

36

[IEEE IEEE MTT-S International Microwave Symposium - IMS 2003 - Philadelphia, PA, USA (8-13 June 2003)] IEEE MTT-S International Microwave Symposium Digest, 2003 - Design and characterization of integrated passive elements on high ohmic silicon

Valletta, E., Van Beek, J., Den Dekker, A., Pulsford, N., Jos, H.F.F., de Vreede, L.C.N., Nanver, L.K., Burghartz, J.N.

Year:

2003

Language:

english

File:

PDF, 313 KB

english, 2003

37

[IEEE ESSDERC 2012 - 42nd European Solid State Device Research Conference - Bordeaux, France (2012.09.17-2012.09.21)] 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - Epitaxial growth of large-area p+n diodes at 400 ºC by Aluminum-Induced Crystallization

Sakic, Agata, Qi, Lin, Scholtes, Tom L.M., van der Cingel, Johan, Nanver, Lis K.

Year:

2012

Language:

english

File:

PDF, 2.07 MB

english, 2012

38

[IEEE 2010 Ninth IEEE Sensors Conference (SENSORS 2010) - Kona, HI (2010.11.1-2010.11.4)] 2010 IEEE Sensors - Optical stability investigation of high-performance silicon-based VUV photodiodes

Shi, L, Nanver, L K, S, A, Nihtianov, S, Gottwald, A, Kroth, U

Year:

2010

Language:

english

File:

PDF, 880 KB

english, 2010

39

Temperature dependence of chemical-vapor deposition of pure boron layers from diborane

Mohammadi, V., de Boer, W. B., Nanver, L. K.

Journal:

Applied Physics Letters

Year:

2012

Language:

english

File:

PDF, 608 KB

english, 2012

40

The health status of a village population, 7 years after a major Q fever outbreak

MORROY, G., VAN DER HOEK, W., NANVER, Z. D., SCHNEEBERGER, P. M., BLEEKER-ROVERS, C. P., VAN DER VELDEN, J., COUTINHO, R. A.

Journal:

Epidemiology and Infection

Year:

2016

Language:

english

File:

PDF, 284 KB

english, 2016

41

[IEEE 2011 International Conference on Microelectronic Test Structures (ICMTS) - Amsterdam, Netherlands (2011.04.4-2011.04.7)] 2011 IEEE ICMTS International Conference on Microelectronic Test Structures - Lateral bipolar structures for evaluating the effectiveness of surface doping techniques

Lorito, Gianpaolo, Qi, Lin, Nanver, L. K.

Year:

2011

Language:

english

File:

PDF, 406 KB

english, 2011

42

Power amplifier PAE and ruggedness optimization by second-harmonic control

Spirito, M., de Vreede, L.C.N., Nanver, L.K., Weber, S., Burghartz, J.N.

Journal:

IEEE Journal of Solid-State Circuits

Year:

2003

Language:

english

File:

PDF, 1.05 MB

english, 2003

43

[IEEE 2009 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Capri, Italy (2009.10.12-2009.10.14)] 2009 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - Evaluating the self-heating thermal resistance of bipolar transistors by DC measurements: A critical review and update

Russo, S., d'Alessandro, V., Spina, L. La, Rinaldi, N., Nanver, L. K.

Year:

2009

Language:

english

File:

PDF, 556 KB

english, 2009

44

[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - Kelvin test structure for measuring contact resistance of shallow junctions

Nanver, L.K., Goudena, E.J.G., Slabbekoorn, J.

Year:

1996

Language:

english

File:

PDF, 477 KB

english, 1996

45

[IEEE 2008 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Monterey, CA (2008.10.13-2008.10.15)] 2008 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - SOA reduction due to combined electrothermal and avalanche effects in multifinger bipolar transistors

d'Alessandro, V., La Spina, L., Rinaldi, N., Nanver, L. K.

Year:

2008

Language:

english

File:

PDF, 355 KB

english, 2008

46

Sub-500/spl deg/C solid-phase epitaxy of ultra-abrupt p/sup +/-silicon elevated contacts and diodes

Civale, Y., Nanver, L.K., Hadley, P., Goudena, E.J.G., Schellevis, H.

Journal:

IEEE Electron Device Letters

Year:

2006

Language:

english

File:

PDF, 269 KB

english, 2006

47

[IEEE 2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - Boston, MA, USA (2007.09.30-2007.10.2)] 2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - Analysis of Electrothermal Effects in Bipolar Current Mirrors

d'Alessandro, V., Nanver, L. K., Zampardi, P. J., Rinaldi, N.

Year:

2007

Language:

english

File:

PDF, 501 KB

english, 2007

48

[IEEE 2010 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2010.12.6-2010.12.8)] 2010 International Electron Devices Meeting - Versatile silicon photodiode detector technology for scanning electron microscopy with high-efficiency sub-5 keV electron detection

Sakic, A., Nanver, L. K., van Veen, G., Kooijman, K., Vogelsang, P., Scholtes, T. L.M., de Boer, W., Wien, W. H. A., Milosavljevic, S., Heerkens, C. Th. H., Knezevic, T., Spee, I.

Year:

2010

Language:

english

File:

PDF, 1.22 MB

english, 2010

49

Pattern Dependency of Pure-Boron-Layer Chemical-Vapor Depositions

Mohammadi, V., De Boer, W., Scholtes, T. L., Nanver, L. K.

Journal:

ECS Transactions

Year:

2012

Language:

english

File:

PDF, 400 KB

english, 2012

50

CMOS-Compatible PureGaB Ge-on-Si APD Pixel Arrays

Sammak, Amir, Aminian, Mahdi, Nanver, Lis K., Charbon, Edoardo

Journal:

IEEE Transactions on Electron Devices

Year:

2016

Language:

english

File:

PDF, 2.86 MB

english, 2016

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